Dr. Bibhudutta "Bibhu" Rout, Assistant Professor
 
 
  Department of Physics
1155 Union Circle, #311427
Denton, Texas  76203		 (940) 369-8127
Physics Building, Room 007
bibhu@unt.edu
 
   
Education:      

Institute of Physics, Bhubaneswar, India, 2001.
Growth, Characterization and Thermal Behaviour of Epitaxial Metallic Layers on Semiconductors and their Self-assembled Micro-structures.

 

Research:       Dr. Rout is actively pursuing research in several experimental areas involving condensed matter physics, materials science, nano-science and technology. His current research interests include materials analysis and modification using high energy focused ion beams; Growth and analysis of micro-nanostructures using UHV techniques involving MBE, E-beam, Ion beam.
Publications:        
  1. "High Energy Heavy Ion Beam Lithography in Silicon," Bibhudutta Rout, Alexander D. Dymnikov, Daniel P. Zachry, Elia V. Eschenazi, Yongqiang Q. Wang, Richard R. Greco and Gary A. Glass, Nucl. Inst. And Meth. B261 (2007) 731-735.
 
  2. "Fabrication of micro-structured tunnels in PMMA using P-beam writing," B. Rout, M. Kamal, A. D. Dymnikov, D. P. Zachry and G. A. Glass, Nucl. Inst. And Meth. B260 (2007) 366-371.
 
  3. "High Energy Focused Ion Beam Technology and Applications at the Louisiana Accelerator Center," G.A. Glass, A. D. Dymnikov, B. Rout, and D.P. Zachry, Nucl. Inst. And Meth. B260 (2007) 372-377.
 
  4. "Patterned microstructures formed with MeV Au implantation in Si(100),"  Bibhudutta Rout, Richard R. Greco, Daniel P. Zachry, Alexander D. Dymnikov, Gary A. Glass, Nucl. Inst. And Meth. B250 (2006) 76-80.
 
  5. "High Energy Focused Ion Beam Nanoprobes: Design and Applications," Gary A. Glass, Bibhudutta Rout, Alexander D. Dymnikov, Elia V. Eschenazi, Richard R. Greco, Daniel P. Zachry  in “Growth, Modification, and Analysis by Ion Beams at the Nanoscale”, edited by Joegr K. N. Lindner, Marcel Toulemonde, William J. Weber, Barney L. Doyle (Mater. Res. Soc. Symp. Proc. 908E, Warrendale, PA, 2006) 0908-OO06-01.
 
  6. "Proton Microbeam irradiation effects on PtBA polymer," J. Kamila, S. Roy, K. Bhattacharjee, B. N. Dev, R. Guico, J. Wang, B. Rout, A. W. Haberl, P. Ayyub, P.V. Satyam, (Bull. Matter. Science).
 
  7. "High energy focused ion beam lithography using P-beam writing," G. A. Glass, B. Rout, A. D. Dymnikov, R. Greco, M. Kamal, J. A. Peeples, J. A. Reinhardt, Nucl. Inst. And Meth. B241 (2005) 397-401.
 
  8. "Maskless micromachining with high-energy focused ion beams," B. Rout, R. D. Greco, A. D. Dymnikov, J. R. Reinhardt, J. Peeples, M. Kamal, M. Lentz, G. A. Glass, Proc. SPIE 5751,  (2005) 1050-1057 – Emerging Lithographic Technologies IX; R. Scott Mackay; Ed.
 
  9. "Thin-film resists for registration of single-ion impacts"; V. Millar, C.I. Pakes, S. Prawer, B. Rout, and D.N. Jamieson, Nanotechnology 16(6) (2005) 823-826.
 
  10. "Long period gratings in multimode fiber fabricated with high-energy ion implantation," K. J. Grant, A. Roberts, D. N. Jamieson, C. Cher, B. Rout, Fiber and Integrated Optics, 22 (2003) 225-237.
 
  11. "Fabrication of  periodic grating structures in Optical fibers, using nuclear microprobe," B. Rout, C. Cher, K. Grant, A. Roberts, D. N. Jamieson ,  Proc. SPIE 4935 (2002) 172 - Smart Structures, Devices, and Systems; Erol C. Harvey, Derek Abbott, Vijay K. Varadan; Eds.
 
  12. "Nanoscale fabrication using single-ion  impacts," V. Miller, C. I. Pakes, A. Cimmino, D. Brett, D. N. Jamieson, S. Prawer, C. J. Yang, B. Rout, R. P. McKinnon, A. S. Dzurak, R. G. Clark, Smart Mater. Struct. 11 (2002) 686.
 
  13. "Pseudo-tomography: Optimizing reconstruction of 3-dimensional images from STIM data," Louis M. Houston, Bibhudutta Rout, Alexander D. Dymnikov, Karen P. Briski and Gary A. Glass, (to appear in Nucl. Inst. And Meth. B).
 
  14. "Phase correlations of elemental maps using nuclear microscopy," B. Rout, D. N. Jamieson, T. Hopf, C. G. Ryan, Nucl. Inst. And Meth.B210 (2003) 129-134.
 
  15. "An investigation of the native oxide of aluminum alloy 7475-T7651 using XPS, AES, TEM, EELS, GDOES and RBS," S. K. Toh, D. G. McCulloch, J. du Plessis, P.J.K. Paterson, A. E. Hughes, D. Jamieson, B. Rout, J.M. Long, A.Stonham, Surface Review and Letters, 10(2-3) (2003) 365-371.
 
  16. "Nuclear microprobe analysis of U-doped (Bi,Pb)2Sr2Ca2Cu3Oy/Ag superconducting tapes," B Rout, J Hendriks, D N Jamieson, R Szymanski, D Milliken and S X Dou, Nucl. Inst. And Meth. B190 (2002) 357-364.
 
  17. "Ion-beam-induced-charge characterization of particle detectors," C. Yang, D. N. Jamieson, S. M. Hearne, C. I. Pakes, B. Rout, E. Gauja, A. J. Dzurak, R.G. Clark, Nucl. Inst. And Meth. B190 (2002) 212-216.
 
  18. "PIXE cluster analysis of ancient ceramics from North Syria," I. E. Kieft, D. N. Jamieson, B. Rout, R. Szymanski, A. S. Jamieson, Nucl. Inst. And Meth. B190 (2002) 492-496.
 
  19. "The Elemental analysis of ancient Indian coins of Kusanas and early medieval period using proton induced X-ray emission (PIXE) technique," N. K. Puri, M. Hajivaliei, S. C. Bedi, N. Singh, I. M. Govil, M. L. Garg, D. K. Handa, K. L. Govil, B. Rout, V. Vijayan, Intr. Jr. of PIXE 13 (3&4) (2003) 149-161.
 
  20. "Characterization of microstructures formed on MeV ion-irradiated silver films on Si(111) surfaces," B Rout, J Kamila, S K Ghose, D P Mahapatra and B N Dev, Nucl. Inst. And Meth. B181 (2001) 268-272.
 
  21. "Microstructures on MeV ion irradiated epitaxial Ag films on Si(111) surfaces:  Scattering and emission studies with an ion microscope," B. Rout, J. Kamila, S. K. Ghose, D. P. Mahapatra and B. N. Dev , Solid State Physics (University Press Hyderabad, India) 43, 326 (2000).
 
  22. "Improvement of Ag(111) epitaxy on Si(111) by MeV Si+ irradiation and ion micro-beam analysis of thermally induce morphology,"  B. Sundaravel, Amal K. Das, S. K. Ghose, B. Rout and B. N. Dev,  Nucl.  Instr. And Meth.   B 156 (1999) 130-134.
 
  23. "Combination of magnetic and electric quadrupole lenses as zoom sextuplet ion microprobe focusing system with minimum spherical aberration," Alexander D. Dymnikov, Bibhudutta Rout, Gary A. Glass, Nucl. Inst. And Meth. B261 (2007) 447-451.
 
  24. "The position of a scanner and its influence on the beam spot size in a nuclear microprobe," A. D. Dymnikov, G. A. Glass, B. Rout, Nucl. Inst. And Meth. B 239 (2005) 250-266.
 
  25. "Upgradating a Duoplasmatron ion source to produce high brightness beam for nuclear microprobe applications with a tandem accelerator," B. Rout, R. Greco, N. Pastore, A. D. Dymnikov, G. A. Glass, Nucl. Inst. And Meth. B241 (2005) 382-386.
 
  26. "Zoom quadrupole focusing systems producing an image of an object," A. D. Dymnikov, G. A. Glass, B. Rout , Nucl. Inst. And Meth. B241 (2005) 402-408.
 
  27. "Retrocutting nuclear microprobe quadruple lens profiles to improve field strength," D. N. Jamieson, R. Szymanski, B. Rout and R. Brenn, Nucl. Inst. And Meth. B 231(1-4) (2005) 49-52.
 
  28. "The Amsterdam Quintuplet Nuclear Microprobe," M. J. J. Van den Putte, B. Rout, R. Szymanski, D. N. Jamieson, J. F. J. Van den Brand,  Nucl. Inst. And Meth.B 10 (2003) 21-26.
 
  29. "The new Melbourne nuclear microprobe system," D N Jamieson, B Rout, R Szymanski, P Spizzirri, A Sakellariou, W Belcher and C G Ryan,    Nucl. Inst. And Meth. B190 (2002) 54-59.
 
  30. "Status of ion microbeam facility at the Institute of Physics, Bhubaneswar, India," B Rout, S K Ghose, D P Mahapatra, B N Dev, H Bakhru and A W Haberl,  Nucl. Inst. And Meth. B181 (2001) 110-115.
 
  31. "Development of an ion micro-beam facility at Institute of Physics, Bhubaneswar," B. Rout, S. K. Ghose, S. Dey, D. P. Mahapatra, B. N. Dev, H. Bakhru, A. W. Haberl, Indian Jour. Of Pure and Appl. Phy. 39(1-2) (2001) 62-64.
 
  32. "Micro Ion-beam facility at Institute of Physics, Bhubaneswar,"  B. Rout, S. K. Ghose, B. Sundaravel, G. Kuri, D. P. Mahapatra and B. N. Dev, P. Sen, H. Bakhru and A. W. Haberl, Journal of Radiation Physics and Chemistry (RPC),  51(4-6) (1998) 677.
 
  33. "Improved High Energy Microbeam techniques," A. Kumar, H. Bakhru, A. W. Haberl, B. Rout,  Nucl.  Instr. And  Math. B; 130 (1997) 219-223.
 
  34. "Structure and magnetic properties of pure and Gd-doped HfO2 thin films," Wendong Wang, Yuanjia Hong, Minghui Yu, Bibhudutta Rout, Gary A. Glass, Jinke Tang, Jour. Of Appl. Phys. 99 (2006) 08M117(1-3).
 
  35. "Microstructural Characterisation of RF Magnetron Sputtered ZnO Thin Films on SiC," A. Trinchi, W. Wlodarski, S. Santucci, D. Di Claudio, M. Passacantando, C. Cantalinim B. Rout, S. J Ippolito, K. Kalantar-Zadeh and G. Sberveglieri, Solid State Phenomena Vol. 99-100 (2004) 123.
 
  36. "Properties of Ga-Zn based mixed oxides for gas sensing applications," A. Trinchi, K. Galatsis, Y.X. Li, W. Wlodarski, S. P. Russo, J. du Plesis and B. Rout , IEEE Journals (in Press).
 
  37. "Channeling studies on self-assembled Au4Si islands on Br-passivated Si(111)  surfaces," B. Sundaravel , K. Sekar,  P. V. Satyam, G. Kuri, B. Rout, S. K. Ghose,  D. P. Mahapatra and B. N. Dev,  Ind. J. Phys.  70A (1996) 687.
 
  38. "Determination of strain in a buried epitaxial CoSi2 layer in Si(111) by MeV ion scattering and  x-ray rocking curve methods," P. V. Satyam, B. Sundaravel, S. K. Ghose, B. Rout, K. Sekar, D. P. Mahapatra and B. N.   Dev, Indian J. Phys.  70A (1996) 783.
 
  39. "Thin film characterization with grazing incidence X-ray  reflectometry,"   P. V. Satyam, S. K. Ghose, B. Sundaravel, B. Rout, and B. N. Dev,  in Thin Film Characterization and Applications, (Eds. Sa. K. Narayandass and D. Mangalraj, Allied Publishers, New Delhi, 1996) page. 394.
 
  40. "Characterization of ion beam synthesized epitaxial Si/CoSi2/Si(111) system with ion and x-ray scattering techniques,"  P. V. Satyam, K. Sekar, G. Kuri, B. Sundaravel, S. K. Ghose, B. Rout, D. P. Mahapatra and B. N. Dev, Semiconductor devices, (Edited by K. Lal; Narosa Publishing House, New Delhi, 1996) Page 370-372.
 
  41. "A high precision technique using x-ray reflectivity for the measurement of surface and interface roughness," P. V. Satyam, D.Bahr, S. K. Ghose, G. Kuri, B. Sundaravel, B. Rout and B.  N. Dev,  Current Science, India  69, (1995) 526.
 
  42. "Shape variation in epitaxial microstructures of gold silicide grown on Br-passivated Si(111) surfaces," S. Chakraborty, J. Kamila, B. Rout ,B. Satpati, P.V. Satyam, B. Sundaravel and B. N. Dev, Surf. Science, Vol 549 (2) (2004) 149-156.
 
  43. "Clustering in Pb thin films on Si(111) and Pb-induced Si surface ordering," B. Rout, J. Kamila, M. Runde, B. N. Dev, Nucl. Inst. And Meth. B190 (2002) 641-645.
 
  44.. "Self-assembled gold silicide wires on bromine-passivated Si(110) surfaces," B Rout, B Sundaravel, Amal K Das, S K Ghose, K Sekar, D P Mahapatra and B N Dev, Jr. of Vacuum Sc. and Tech. B 18(4) (2000) 1847-1852.
 
  45. "Growth of self-assembled nanostructures on sufaces," Amal K. Das, S. K. Ghose, J. Kamila, B. Rout and B. N. Dev, Solid State Physics (University Press Hyderabad, India) 43, 144 (2000).
 
  46. "Thermal instability in Thin films: Self-assembling epitaxial island" B. Sundaravel, P. V. Satyam, G. Kuri, B. Rout, S. K. Ghose, K. Sekar, D. P. Mahapatra and  B. N. Dev,  Thin Film Characterization and Applications, (Eds. Sa. K. Narayandass and D. Mangalraj, Allied Publishers, New Delhi, 1996) page. 256.
 
  47. "Ion-irradiation-induced mixing, interface broadening and period dilation in Pt/C multilayers," S K Ghose, D K Goswami, B Rout, B N Dev, G Kuri and G Materlik, Appl. Phy.Lett.79(4) (2001) 467.
 
  48. "Redistribution of Ni implanted into InP," T. K. Chini, S. K. Ghose, B. Rout, B. N. Dev, M. Tanemura, and F. Okuyama, Eur. Phys. J. AP 13 (2001) 83.
 
  49. "Radiation damage and surface modification of GaAs(001) MeV C+ and C2+ co-implantation  with Ga2+," S. K. Ghose, G. Kuri, A. K. Das, B. Rout, D. P. Mahapatra, B. N. Dev,  Nucl. Instr. And Meth. B 156 (1999) 125-129.
 
  50. "Sb implantation in Si(100) : Channeling and damage studies," Soma Dey, G. Kuri, B.Rout, Shikha Varma, Solid State Phys. (University Press Hyderabad, India) 42 (1999) 268.
 
  51. "Range profile and lattice location of MeV implant  in Si (100)," S. Dey, G. Kuri, B. Rout, S. Varma, Nucl. Instr. And Meth  B, 142 (1998) 35-42.
 
  52. "High energy Ni Implantation in InP," T. K. Chini, S. R. Bhattacharya, D. Basu, B. Rout, S. Ghose, B. Sundaravel, B. N. Dev, F. Okuyama, M. Kaneko, J. Mater. Sci. Lett.  17 (1998) 1117.
 
  53. "Characterization of MeV implant of Antimony in Si(100)," Soma Dey, G. Kuri, B. Rout, Shikha Varma,
 Solid State Phys. (University Press Hyderabad, India) 40C (1997) 395.
 
  54. "MeV As and Au ion implantation in Si, GaP, GaAs, InSb and LiNbO3 : Study of range and lattice location," G.Kuri, B.Sundaravel, B. Rout, D.P.Mahapatra and  B.N.Dev,  Nucl. Instr. And Meth.  B111 (1996) 234-243.
 
  55. "Effect of MeV Au ion implantation on the  composition of GaAs upon vacuum annealing  PIXE and XRF studies," G. Kuri, B. Rout, B. Sundaravel, D. P. Mahapatra  and B. N. Dev, Nucl. Instr. And Meth.  B 119 (1996) 403-410.
 
Talks delivered in Conferences, Symposia, Workshops and Faculty level
  1. Materials Analysis and Micro-fabrication with High Energy Focused Ion Beam, Department of Physics, University of North Texas, Denton, TX,  November 2006.
 
  2. Microfabrications with High Energy Focus Ion Beam, Institute of Physics, Bhubaneswar, India, October 2006.
 
  3. Fabrication of Three-Dimensional Microstructures in SU-8 using High Energy Focused Ion Beam, 19th International Conference on the Application of Accelerators in Research and Industry (CAARI-2006), August 20-25, 2006, Fort Worth, TX.
 
  4. High Energy Heavy Ion Beam Lithography in Silicon, 19th International Conference on the Application of Accelerators in Research and Industry (CAARI-2006), August 20-25, 2006, FortWorth, TX.
 
  5. High Energy Focused Ion Beam System (HEFIB): Design, Construction, Materials analysis, Micro-fabrication; “Workshop on New Trends in Ion Beam Research”, Nov. 14-16, 2005, Gramado, Brazil.
 
  6. Maskless micromachining with high-energy focused ion beams; 9th International conference on “Emerging Lithographic Technologies”, March 1-3, 2005, San Jose, CA.
 
  7. Research and Developments with Ion Accelerator at Louisiana Accelerator Center, “Louisiana Materials Research Society” Symposium, Feb 2005, New Orleans, LA.
 
  8. Optimization of  ion source parameters for high resolution nuclear microprobe applications with a tandem accelerator; 18th International Conference on the Application of Accelerators in Research and Industry (CAARI-2004), October 2004, Fort Worth, TX.
 
  9. Materials analysis and micro-fabrications using Nuclear Microprobe; Department of Physics, University of Louisiana at Lafayette, March 2004.
 
  10. Ultra low dose irradiation of thin-film resists for nano-fabrications in polymers; Institute of Physics,Bhubaneswar, India, November 2003
 
  11. Phase correlations of elemental maps using nuclear microscopy; Microanalytic Research Centre, School of Physics, University of Melbourne, May 2003, Australia.
 
  12. Focus MeV ion beam for analysis and fabrication of micro and nano structures; Department of Applied Physics, Royal Melbourne Institute of Technology, Melbourne, April 2003.
 
  13. Phase correlations of elemental maps using nuclear microscopy; 7th Australian Microanalysis Society (AMAS-VII) workshop, Royal Melbourne Institute of Technology, Melbourne, February 2003.
 
  14. Development of new generation nuclear microprobes; Australian Institute of Physics  Conference, Sydney, Australia, July 2002.
 
  15. Nuclear microprobe for analysis and synthesis of micro and nano structures; Institute of Physics, Bhubaneswar, India, September, 2001.
 
  16. Nuclear microprobe analysis of BISCO/Ag superconducting tapes; Institute of Physics, Bhubaneswar, India, August, 2001.
 
  17. Nuclear microprobe analysis of BISCO/Ag superconducting tapes; 15th International conference on Ion Beam Analysis (IBA-15), Cairns, Australian, July, 2001.
 
  18. Technological applications of ion microbeam; National Science and Technology Day celebrations; Institute of Physics, Bhubaneswar, India, May  11, 2000.
 
  19. A high energy ion micro-beam facility for materials characterization; Solid State Physics Symposium of DAE, Kalpakkam, India, Dec.20-25, 1999.
 
  20. Development of an ion micro-beam facility at Institute of Physics, Bhubaneswar; Prof. A. P. Patro Memorial workshop on Accelerator technology, Nuclear Science Center, New Delhi, India, November 15-17, 1999.
 
  21. Materials analysis using ion microbeam; National mini-conference on materials and surface science with accelerators;  Institute of Physics, Bhubaneswar; India, October 4-6, 1999.
 
  22. Ion microbeam facility at Institute of Physics, Bhubaneswar, India (poster); International conference on Ion Beam Analysis (IBA-14) at Dresden, Germany; July 26-30,1999.
 
  23. 3MV Pelletron accelerator facility at Institute of Physics, Bhubaneswar, India; Tata Institute of Fundamental Research (TIFR), Bombay, India, December 27-28, 1998.
 
  24. Growth and Characterization of gold-silicide microstructures on Si surfaces, Naval Research Laboratory, Washington, D. C., U.S.A., July, 1997.
 
  25. Micro ion-beam studies on self assembled epitaxial Au4Si islands on Br-passivated Si(111) surfaces;  Solid State Physics Symposium of DAE, Bombay, India, Dec.27-31, 1996.
 

For more Information:

You may e-mail Dr. Rout at bibhu@unt.edu

Or send mail to

Department of Physics
1155 Union Circle, #311427
Denton, Texas  76203

(940) 369-8127

Last Updated 30-Sep-2008